OCCIM-DEV Program
Combined computational image integration and image processing for transparent micro-devices
Non-destructive inspection for microfluidics and microdevices
ASE Optics has received funding for the development of its instrument. FASTTESTThe Horizon 2020 SME Innovation Associate, with its proposal “Optimised integration of Combined Computational Imaging and image processing for transparent Micro-Devices” (OCCIM-DEV), has developed a new system for non-destructive 3D inspection of microfluidic devices and other “microdevices”, through the Horizon 2020 SME Innovation Associate program.
Objective: to develop an instrument for the inspection of microfluidic chips and other micro-components.
Specializing in the design and development of precision optical systems, ASE Optics is also a strongly R&D oriented company, constantly working to expand its capacity for innovation, both internally and for customers and their projects. In the last year we have been working on the development of an instrument for non-destructive and 3D inspection of microfluidic chips and other micro-scale devices.
The hiring of a research associate (RA) was a strategic and key point for the advancement and progress in the development of our metrology instrument, FASTTEST, to achieve a more integrated final solution.
Our AI: Who is it?
Marino Maiorino is a doctor (PhD) specialized in the characterization of solid state detectors for imaging applications. He has extensive experience in digital signal processing, control software development and algorithm implementation and optimization. His main task has been the improvement of algorithms and high-tech image processing. Marino has joined the R&D department of ASE Optics, and has led the integration of the first FASTTEST system for nondestructive inspection of microfluidic chips.
Program development: software integration and optimization of the various assemblies that make up the FASTTEST instrument.
The main work of the OCCIM-DEV project has focused on software integration and optimization of the different components and subsystems that make up FASTTEST. OCT (optical coherence tomography) and FFT (Fast fourier transform) measurements that allow measurement of the depth at which they have been performed and successfully calibrated.
Combination OCT + machine vision system
The OCT data acquisition rate has reached 40,000 profiles per second. A user-friendly interface has also been developed that allows the user to select which OCT path to scan. Similarly, the system can self-configure and perform different measurement operations according to the route entered by the user.
On the other hand, the machine vision system is able to recognize the patterns that will be used to automatically guide the OCT beam to the critical regions and parts of the microdevice to be inspected.
Currently, FASTTEST has been demonstrated and tested with potential customers, and is currently being adapted for a medical device manufacturer that wishes to apply the technology to solve a specific quality control problem that has not been solved to date. The ability to tailor the software to the needs of each customer and each problem has increased the system’s market opportunities.
Some results: a 3D map of the inspection area of a micro-device type
The main panel shows the 3D map of the part of a syringe microneedle. Through the software, the area to be inspected is selected, and the same software reconstructs the depth map in “false” colors. Each color corresponds to a certain depth value, according to the color scale that can be seen on the right side of the image:
Then the same information, manipulated with external software:
Significant advances and improvements of the FASTTEST instrument for nondestructive micrometer inspection
The collaboration between Marino Maiorino and the other professionals of ASE Optics has allowed significant improvements of FASTTEST, placing this equipment beyond the state of the art of other technologies for nondestructive inspection at micrometer level.
The 3D measurement rates achieved, together with the drastic reduction of the data load, results in equipment that matches the production rates of an automated system, a result that has never been achieved before.
As a result, the manufacturer of microfluidic chips or other micro-devices can integrate the system into their production lines, improving manufacturing and quality control. Thanks to the data obtained in real time, the manufacturer can quickly detect problems or alterations in the manufacturing process, solve them and reduce the amount of non-conforming or defective products.
FASTTEST is a fully autonomous system and, as such, has a comprehensive set of automated diagnostic tools for reliable hardware monitoring.
FASTTEST is also a guarantee of quality for end users of microdevices. Currently, the main market for microfluidic microdevices and chips is the medical sector, with the rise of disposable point-of-care devices, so the long-term impact of FASTTESTs will be beneficial to the safety and health of all citizens.
However, this breakthrough in the development of FASTTEST for non-destructive 3D inspection of microfluidic chips and other microdevices has been made possible by the program H2020 SME Innovation Associate Programme (reference no. 739648), financed through the “Executive Agency for Small and Medium-sized Enterprises” (EASME), established by the European Commission to manage various European Union programs.
